Freitag 22.10.2010 14.00 Uhr Seminarraum 2P4
Anandh Subramaniam
Indian Institute of Technology, Kanpur
Anglepoise lamps, Zero Stiffness, Image Forces and Eshelby Bends
Prof. Dr. P. van Aken
Montag 04.10.2010 11.00 Uhr Seminarraum 2P4
Dr. Andrew Stewart
Johannes Gutenberg-Universität Mainz
Electron Crystallography and the Automated Diffraction Tomography Technique
Montag 13.09.2010 11.00 Uhr Seminarraum 2P4
Prof. Dr. Shunsuke Muto
Nagoya University, Japan
Statistical signal processing of S/TEM-EELS datasets - Extraction of information without reference -
Dienstag 27.07.2010 14.00 Uhr Seminarraum 2P4
Prof. Cecile Hebert
EPFL SB-CIME Lausanne, Switzerland
Cathodoluminescence and angular dependent EELS in the TEM
Montag 05.07.2010 11.00 Uhr Seminarraum 2P4
Prof. Dr. Masashi Watanabe
Dept of Materials Science and Engineering, Lehigh University,Bethlehem, USA
Atomic-resolution Chemical Analysis in Aberration-corrected Scanning Transmission Electron Microscopy
Freitag 16.04.2010 11.00 Uhr Seminarraum 5H7
Prof. Dr. Qing Chen
Key Laboratory for the Physics and Chemistry of the Nanodevices and Department of Electronics Peking University, China
In Situ Study on the Mechanical and Electronic Properties of Individual Thin Carbon Nanotubes inside a SEM