HOME
Zurück zur Startseite
Luftbild_Institut  
mainpicNavi
Research
Publications
The Institute
News
Service
[Intranet]
X-ray Diffraction Laboratory
Research Acitivities
Grain Interaction
Research Acitivities
  Stressed Thin Films     Grain Interaction     Diffusion and Reactions     Deformed Metals     Method Development  


Grain Interaction Models for Residual Stresses

The evaluation of residual stresses in polycrystalline materials requires models for the grain interaction. The development of new models for thin layers takes into account the anisotropy of the elastic properties, the (often columnar) microstructure and the crystallographic texture.

stress


Lattice strain(ε-)sin2ψ plot (ψ= angle of tilt of specimen) for the (004) reflection from a 500 nm thick sputtered Cu layer with (111) fibre texture: measured by X-ray diffraction · and simulated for a stress of σ|| = 180 MPa in the layer using different models for the grain interaction. ...... Voigt model, - - - Reuss model, ____ new model for anisotropic grain interaction.


drucken Print version topPfeil  Top
© 2012, Max Planck Institute for Metals Research, Stuttgart