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| Research Acitivities |
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Defects in Severely Deformed Metals
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Profile analysis of broadened X-ray reflections is employed to determine microstrains and crystallite sizes (on nanometer scales) of severely deformed metals. The size and strain parameters are derived not only from X-ray diffraction data but also from neutron diffraction data up to large momentum transfer. The characterization of local distortion fields and the dislocation arrangements by the computer simulation of broadened line profiles is a major topic of these activities.
Fourier transform of the (110) and (220) reflections of ball milled Mo powder. --- from X-ray diffraction, ____ simulation with crystallite size effect and microstrain.
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