|
|
|
 |
|
|
| Stuttgart Center for Electron Microscopy (StEM) |
 |
|
|
|
|
|
StEM (Stuttgart Center for Electron Microscopy)
|
|
|
|
|
|
Sub-Electronenvolt- Sub-Angström-Microscope (SESAM) |
The Stuttgart Center for Electron Microscopy (StEM) possesses extensive expertise in the field of transmission electron microscopy (TEM) and scanning electron microscopy (SEM). Besides conducting its own research, StEM also collaborates with departments in both Stuttgart Max Planck Institutes, as well as with other research institutions and industries.
Head: Prof. Dr. Peter A. van Aken
| Heisenbergstr. 3 |
Phone: + 49 711 689-3529 |
| 70569 Stuttgart |
Fax: + 49 711 689-3522 |
|
|
|
From complex sample preparation and imaging of atomic structures (Fig. 1) to analysis of chemical composition (Fig. 2) and electronic structures (Fig. 3),
StEM uses a wide range of advanced techniques for materials characterisation on the atomic scale.
 |
 |
 |
Fig. 1
High-resolution
TEM (HRTEM) image
of a TiO island
on SrTiO3. |
Fig. 2
SiC ceramic sintered with Lu2O3-containing
additives. Left: Bright field image;
Right: Chemical map (energy-filtered TEM,
EFTEM) with silicon (pink), carbon (blue),
lutetium (green) and oxygen (yellow). |
Fig. 3
Left: High-resolution TEM image of a grain boundary in SrTiO3;
Right: Variation of low-loss EELS spectra across the grain boundary. |
|
|
|
|
|
|
|
Top