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| Facilities |
| Diffractometric Facilities |
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Phase analysis at room temperature |
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Θ-Θ diffractometer in Bragg-Brentano geometry (Bruker D8 Advance); Cu-Kα with energy-dispersive detector. |
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Phase transformations at high temperatures |
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Θ-Θ diffractometer in Bragg-Brentano geometry (Philips); Cu-Kα or Co-Kα with secondary monochromator; linear-detector; high temperature chamber for vacuum or protective gas up to 2000°C.
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Line-profile analysis; microstress, crystallite size |
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Θ-Θ diffractometer in Bragg-Brentano geometry (Philips); Cu-Kα1 with primary monochromator. |
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Residual stress and texture |
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Eulerian cradle (two Philips MRD instruments); Cu-Kα; parallell beam optics with X-ray lens or X-ray mirror; secondary monochromator. |
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Eulerian cradle, used for X-ray diffraction measurements of texture and (macro)stress.
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Non-ambient (-100°C to 900°C) investigations of residual stress and texture |
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High-brilliance rotating anode X-ray source (Bruker Turbo X-ray source); Cu-Kα parallell beam optics with collimating X-ray mirror (Xenocs); heating/cooling chambers Anton Paar DCS350 and DHS900. |
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Diffractometer equipped with a rotating-anode X-ray source, an Eulerian cradle and heating/cooling chambers (optional).
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High resolution; epitactic layers |
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Eulerian cradle (Siemens D5000 HRX); Cu-Kα1 with 4-fold primary monochromator and 2-fold secondary analysator. |
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Reflectometry with thin layers |
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Θ-Θ reflectometer (Bruker AXS D5005); Cu-Kα; parallell beam optics with X-ray mirror and secondary monochromator. |
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